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GB/T17626.2-2006（idt IEC61000-4-2:2001）與GB/T17626.2-1998（idt IEC61000-4-2:1995）兩項(xiàng)標(biāo)準(zhǔn)差異分析報(bào)告

 

GB/T17626.2-2006（idt IEC61000-4-2:2001）為版本的國家標(biāo)準(zhǔn)，與GB/T17626.2-1998（idt IEC61000-4-2:1995）的標(biāo)準(zhǔn)主要差異如下：
1.    增加了條款7.1.3不接地的設(shè)備的試驗(yàn)方法
標(biāo)準(zhǔn)差異：為了保證不接地設(shè)備在靜電放電試驗(yàn)中不累積電荷，給出了試驗(yàn)中釋放電荷的要求、方法。
IEC61000-4-2:2001原文
7.1.3 Test method for ungrounded equipment
The test method described in this subclause is applicable to equipment or part（s） of equipmentwhose installation specifications or design preclude connection to any grounding
system. Equipment, or parts thereof, includes portable, battery-operated and double-insulatedequipment （class II equipment）.
Rationale: Ungrounded equipment, or ungrounded part（s） of equipment, cannot discharge itself similarly to class I mains-supplied equipment. If the charge is not removed before the next ESD pulse is applied, it is possible that the EUT or part（s） of the EUT be stressed up to
twice the intended test voltage. Therefore, double-insulated equipment could be charged at
an unrealistically high charge, by accumulating several ESD discharges on the capacitance ofthe class II insulation, and then discharge at the breakdown voltage of the insulation with a
much higher energy.
The general test set-up shall be identical to the ones described in 7.1.1 and 7.1.2
respectively.
To simulate a single ESD event （either by air or by contact discharge）, the charge on the EUT shall be removed prior to each applied ESD pulse.
The charge on the metallic point or part to which the ESD pulse is to be applied, for example,
connector shells, battery charge pins, metallic antennae, shall be removed prior to each
applied ESD test pulse.
When one or several metallic accessible parts are subject to the ESD test, the charge shall be removed from the point where the ESD pulse is to be applied, as no guarantee can be given about the resistance between this and other accessible points on the product.
A cable with 470 k??bleeder resistors, similar to the one used with the horizontal and vertical
coupling planes, shall be used; see 7.1.
As the capacitance between EUT and HCP （table-top） and between EUT and GRP （floorstanding） is determined by the size of the EUT, the cable with bleeder resistors may remain installed during the ESD test when functionally allowed. In the discharge cable, one resistor shall be connected as close as possible, preferably less than 20 mm from the EUT test point.The second resistor shall be connected near the end of the cable attached to the HCP fortable-top equipment （see figure 8）, or GRP for floor-standing equipment （see figure 9）.
The presence of the cable with the bleeder resistors can influence the test results of some
equipment. In case of dispute, a test with the cable disconnected during the ESD pulse takes
precedence over the test with the cable installed during the test, provided that the charge has
sufficiently decayed between the successive discharges.
As an alternative, the following options can be used:
——the time interval between successive discharges shall be extended to the time necessary to allow natural decay of the charge from the EUT;
——a carbon fibre brush with bleeder resistors （for example, 2 ??470 k?） in the grounding cable;
???an air-ionizer to speed-up the "natural" discharging process of the EUT to its environment.
The ionizer shall be turned off when applying an air-discharge test. The use of any alternative
method shall be reported in the test report.
NOTE In case of dispute concerning the charge decay, the charge on the EUT can be monitored by a noncontacting
electric field meter. When the charge has decayed below 10 % of the initial value, the EUT is considered
to be discharged.
The tip of the ESD generator shall be held normal （perpendicular） to the surface of the EUT.
7.1.3.1 Table-top equipment
For table-top equipment, the EUT is placed on the horizontal coupling plane on top of the
insulating foil （0,5 mm thick）, as described in 7.1.1 and figure 5.
When a metallic accessible part, to which the ESD pulse is to be applied, is available on the EUT,this part shall be connected to the HCP via the cable with bleeder resistors; see figure 8.
7.1.3.2 Floor-standing equipment
Floor-standing equipment without any metallic connection to the ground reference plane shall be installed similarly to 7.1.2 and figure 6.
A cable with bleeder resistors shall be used between the metallic accessible part, to which the ESD pulse is to be applied, and the ground reference plane （GRP）; see figure 9.
GB/T17626.2-2006原文
7.1.3不接地設(shè)備的試驗(yàn)方法        
本子條款描述的試驗(yàn)方法適用于安裝規(guī)范或設(shè)計(jì)不與任何接地系統(tǒng)連接的設(shè)備或設(shè)備部件。設(shè)備或設(shè)備部件，包括便攜式、電池供電和雙重絕緣設(shè)備（II類設(shè)備）。
基本原理：不接地設(shè)備或設(shè)備的不接地部件不能如I類供電設(shè)備自行放電。若在下一個(gè)靜電放電脈沖施加前電荷未消除，受試設(shè)備或受試設(shè)備的部件上的電荷累積可能使電壓為預(yù)期試驗(yàn)電壓的兩倍。因此，雙重絕緣設(shè)備的絕緣體電容經(jīng)過幾次靜電放電累積，可能充電至異常高，然后以高能量在絕緣擊穿電壓處放電。
試驗(yàn)配置應(yīng)分別與7.1.1和7.1.2的描述相同。
為模擬單次靜電放電（空氣放電或者接觸放電），在施加每個(gè)靜電放電脈沖之前應(yīng)消除受試設(shè)備上的電荷。
在施加每個(gè)靜電放電脈沖之前，應(yīng)消除施加靜電放電脈沖的金屬點(diǎn)或部位上的電荷，如連接器外殼、電池充電插腳、金屬天線。
當(dāng)對一個(gè)或幾個(gè)可接觸到的金屬部分進(jìn)行靜電放電試驗(yàn)，由于不保證能給出產(chǎn)品上該點(diǎn)和其它點(diǎn)間的電阻，應(yīng)消除施加靜電放電點(diǎn)的電荷。
應(yīng)使用類似于水平耦合板和垂直耦合板用的帶有470 kΩ泄放電阻的電纜，見7.1。
因受試設(shè)備和水平耦合板（臺(tái)式）之間以及受試設(shè)備和接地參考平面（落地式）之間的電容取決于受試設(shè)備的尺寸，靜電放電試驗(yàn)時(shí)，如果功能允許，應(yīng)安裝帶泄放電阻的電纜。放電電纜的一個(gè)電阻應(yīng)盡可能靠近受試設(shè)備的試驗(yàn)點(diǎn)，小于20 mm。第二個(gè)電阻應(yīng)靠近電纜的末端，對于臺(tái)式設(shè)備電纜連接于水平耦合板上（見圖8），對于立式設(shè)備電纜連接于接地參考平面上（見圖9）。
帶泄放電阻電纜的存在會(huì)影響某些設(shè)備的試驗(yàn)結(jié)果。有爭議時(shí)，若在連續(xù)放電之間電荷能有效地衰減，施加靜電放電脈沖時(shí)斷開電纜的試驗(yàn)優(yōu)先于連接上電纜的試驗(yàn)。
以下選擇可作為替代方法：
── 連續(xù)放電的時(shí)間間隔應(yīng)長于受試設(shè)備的電荷自然衰減所需的時(shí)間；
── 使用帶泄放電阻和炭纖維刷的接地電纜（例如，2×470 kΩ）；
── 使用加速受試設(shè)備的電荷“自然”泄放到環(huán)境的空氣-離子發(fā)生器。
當(dāng)施加空氣放電時(shí)，離子發(fā)生器應(yīng)關(guān)閉。任何替代方法的使用應(yīng)在試驗(yàn)報(bào)告中注明。
注 在電荷衰減有爭議時(shí)，可用非接觸電場計(jì)監(jiān)視受試設(shè)備上的電荷。當(dāng)放電衰減至低于初始值的10％后，受試設(shè)備被認(rèn)為已放電。
靜電放電發(fā)生器的電極頭通常應(yīng)垂直于受試設(shè)備的表面。
7.1.3.1臺(tái)式設(shè)備
對于臺(tái)式設(shè)備，如7.1.1和圖5所述，受試設(shè)備放于絕緣襯墊（厚0.5 mm）上, 絕緣襯墊位于水平耦合板上。
對受試設(shè)備上可觸及的金屬部分施加靜電放電，其金屬部分和水平耦合板之間應(yīng)使用帶泄放電阻的電纜連接（見圖8）。
7.1.3.2落地式設(shè)備
對于與接地參考平面無任何金屬連接的落地式設(shè)備，安裝應(yīng)類似于7.1.2和圖6。
對受試設(shè)備上可觸及的金屬部分施加靜電放電，其金屬部分和接地參考平面（GRP）之間應(yīng)使用帶泄放電阻的電纜連接（見圖9）。
2.    修改了條款8.3.1對受試設(shè)備直接施加放電的方法
標(biāo)準(zhǔn)差異：進(jìn)行了語言的重新組織，GB/T 17626.2-1998（idt IEC61000-4-2:1995）對直接放電施加位置描述比較模糊，GB/T17626.2-2006（idt IEC61000-4-2:2001）標(biāo)準(zhǔn)明確了在靜電放電試驗(yàn)中哪些部位需要施加靜電放電，如何施加，增加了試驗(yàn)的可操作性，具體明確的技術(shù)要求如下：
IEC61000-4-2:2001
8.3.1 Direct application of discharges to the EUT
Unless stated otherwise in the generic, product-related or product-family standards, the static
electricity discharges shall be applied only to those points and surfaces of the EUT which are
accessible to persons during normal use. The following exclusions apply （i.e. discharges are
not applied to those items）:
a） those points and surfaces which are only accessible under maintenance. In this case,
special ESD mitigation procedures shall be given in the accompanying documentation;
b） those points and surfaces which are only accessible under service by the （end-）user.
Examples of these rarely accessed points are as follows: battery contacts while changing
batteries, a cassette in a ephone answering machine, etc.;
c） those points and surfaces of equipment which are no longer accessible after fixed
installation or after following the instructions for use, for example, the bottom and/or wallside
of equipment or areas behind fitted connectors;
d） the contacts of coaxial and multi-pin connectors which are provided with a metallic
connector shell. In this case, contact discharges shall only be applied to the metallic shell
of that connector.
Contacts within a non-conductive （for example, plastic） connector and which are
accessible shall be tested by the air-discharge test only. This test shall be carried out by
using the rounded tip finger on the ESD generator.
In general, six cases shall be considered:

e） those contacts of connectors or other accessible parts that are ESD sensitive because of
functional reasons and are provided with an ESD warning label, for example, r.f. inputs
from measurement, receiving or other communication functions.
Rationale: Many connector ports are designed to handle high-frequency information, either
analogue or digital, and therefore cannot be provided with sufficient overvoltage protection
devices. In the case of analogue signals, bandpass filters may be a solution. Overvoltage
protecting diodes have too much stray capacitance to be useful at the frequencies at
which the EUT is designed to operate.
In all previous cases, special ESD mitigation procedures are recommended, to be given in
the accompanying documentation.
GB/T17626.2-2006
8.3.1對受試設(shè)備直接施加的放電
除非在通用標(biāo)準(zhǔn)、產(chǎn)品標(biāo)準(zhǔn)或產(chǎn)品類標(biāo)準(zhǔn)中有其它規(guī)定，靜電放電只施加在正常使用時(shí)人員可接觸到的受試設(shè)備上的點(diǎn)和面。以下是例外的情況（亦即，放電不施加在下述點(diǎn)）：
a）    在維修時(shí)才接觸得到的點(diǎn)和表面。這種情況下，特定的靜電放電簡化方法應(yīng)在相關(guān)文件中注明。
b）    zui終用戶保養(yǎng)時(shí)接觸到的點(diǎn)和表面。這些極少接觸到的點(diǎn)，如換電池時(shí)接觸到的電池、錄音中的磁帶等。
c）    設(shè)備安裝固定后或按使用說明使用后不再能接觸到的點(diǎn)和面，例如，底部和/或設(shè)備的靠墻面或安裝端子后的地方。
d）    外殼為金屬的同軸連接器和多芯連接器可接觸到的點(diǎn)。該情況下，僅對連接器的外殼施加接觸放電。
非導(dǎo)電（例如，塑料）連接器內(nèi)可接觸到的點(diǎn)，應(yīng)只進(jìn)行空氣放電試驗(yàn)。試驗(yàn)使用靜電放電發(fā)生器的圓形電極頭。
通常，應(yīng)考慮以下六種情況:

例    連接器外殼    涂層材料    空氣放電    接觸放電
1    金屬    無    -    外殼
2    金屬    絕緣    涂層    可接觸的外殼
3    金屬    金屬    -    外殼和涂層
4    絕緣    無    a    -
5    絕緣    絕緣    涂層    -
6    絕緣    金屬    -    涂層
注：若連接器插腳有防靜電放電涂層，涂層或設(shè)備上采用涂層的連接器附近應(yīng)有靜電放電警告標(biāo)簽。
a若產(chǎn)品（類）標(biāo)準(zhǔn)要求對絕緣連接器的各個(gè)插腳進(jìn)行試驗(yàn)，應(yīng)采用空氣放電。

e） 由于功能原因?qū)o電放電敏感并有靜電放電警告標(biāo)簽的連接器或其它接觸部分可接觸到的點(diǎn)，如測量、接收或其它通訊功能的射頻輸入端。
基本原理: 許多連接器端子用于處理模擬或數(shù)字的高頻信息，因而不能使用充分的過壓保護(hù)裝置。過壓保護(hù)二極管的寄生電容妨礙受試設(shè)備工作頻段內(nèi)的工作。對于模擬信號，帶通濾波器可能是解決方案。
在上述情況中，推薦的特定靜電放電簡化步驟應(yīng)在相關(guān)文件中注明。
3. 修改了條款8.3.2.1對水平耦合板施加放電的方法
標(biāo)準(zhǔn)差異：進(jìn)行了語言的重新組織，GB/T 17626.2-1998（idt IEC61000-4-2:1995）對施加的方法描述比較簡略，且要求靜電放電槍垂直于放電耦合版；
GB/T17626.2-2006（idt IEC61000-4-2:2001）標(biāo)準(zhǔn)明確了在靜電放電試驗(yàn)中靜電槍施加的位置，增加了試驗(yàn)的可操作性，且要求靜電放電槍在水平方向?qū)ζ溥吘壥┘樱唧w要求如下：
IEC61000-4-2:2001
8.3.2.1 Horizontal coupling plane （HCP） under the EUT
Discharge to the HCP shall be made horizontally to the edge of the HCP.
At least 10 single discharges （in the most sensitive polarity） shall be applied at the front edge
of each HCP opposite the centre point of each unit （if applicable） of the EUT and 0,1 m from
the front of the EUT. The long axis of the discharge electrode shall be in the plane of the HCP
and perpendicular to its front edge during the discharge.
The discharge electrode shall be in contact with the edge of the HCP （see figure 5）.
In addition, consideration should be given to exposing all sides of the EUT to this test.
GB/T17626.2-2006
8.3.2.1在受試設(shè)備下面的水平耦合板
對水平耦合板放電應(yīng)在水平方向?qū)ζ溥吘壥┘印?br />在距受試設(shè)備每個(gè)單元（若適用）中心點(diǎn)前面的0.1 m處水平耦合板邊緣，至少施加10 次單次放電（以zui敏感的極性）。放電時(shí)，放電電極的長軸應(yīng)處在水平耦合板的平面，并與其前面的邊緣垂直。
放電電極應(yīng)接觸水平耦合板的邊緣（見圖5）。
另外，應(yīng)考慮對受試設(shè)備的所有面都施加放電試驗(yàn)。
4. 修改了GB/T 17626.2-1998（idt IEC61000-4-2:1995）條款9試驗(yàn)結(jié)果和報(bào)告，在GB/T17626.2-2006（idt IEC61000-4-2:2001）中將該部分拆分為兩章：9. 試驗(yàn)結(jié)果的評價(jià)，10.試驗(yàn)報(bào)告
1）標(biāo)準(zhǔn)差異：進(jìn)行了語言的重新組織，GB/T17626.2-2006（idt IEC61000-4-2:2001）明確指出性能降低或功能喪失的等級劃分是由制造商、需要方或制造商和購買方協(xié)商后確定的，推薦性的結(jié)果評價(jià)中也充分體現(xiàn)了該點(diǎn)。新版要求如下：
IEC61000-4-2:2001
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its
manufacturer or the requestor of the test, or agreed between the manufacturer and the
purchaser of the product. The recommended classification is as follows:
a） normal performance within limits specified by the manufacturer, requestor or purchaser;
b） temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance, without operator intervention;
c） temporary loss of function or degradation of performance, the correction of which requires
operator intervention;
d） loss of function or degradation of performance which is not recoverable, owing to damage
to hardware or software, or loss of data.
The manufacturer’s specification may define effects on the EUT which may be considered
insignificant, and therefore acceptable.
This classification may be used as a guide in formulating performance criteria, by committees
responsible for generic, product and product-family standards, or as a framework for the
agreement on performance criteria between the manufacturer and the purchaser, for example
where no suitable generic, product or product-family standard exists.
GB/T17626.2-2006
9試驗(yàn)結(jié)果的評價(jià)
試驗(yàn)結(jié)果應(yīng)依據(jù)受試設(shè)備在試驗(yàn)中的功能喪失或性能降低現(xiàn)象進(jìn)行分類，相關(guān)的性能水平由設(shè)備的制造商或需要方確定，或由產(chǎn)品的制造商和購買方雙方協(xié)商同意。推薦按如下要求分類：
a）    在制造商、委托方或購買方規(guī)定的限值內(nèi)性能正常；
b）    功能或性能暫時(shí)喪失或降低，但在騷擾停止后能自行恢復(fù)，不需要操作者干預(yù)；
c）    功能或性能暫時(shí)喪失或降低，但需操作者干預(yù)才能恢復(fù)；
d）    因設(shè)備硬件或軟件損壞，或數(shù)據(jù)丟失而造成不能恢復(fù)的功能喪失或性能降低。
由制造商提出的技術(shù)規(guī)范可以規(guī)定對受試設(shè)備產(chǎn)生的某些影響是不重要的，因而是可接受的試驗(yàn)影響。
這種分類可以由負(fù)責(zé)相關(guān)產(chǎn)品的通用標(biāo)準(zhǔn)、產(chǎn)品標(biāo)準(zhǔn)和產(chǎn)品類標(biāo)準(zhǔn)的專業(yè)標(biāo)準(zhǔn)化技術(shù)委員會(huì)作為明確表達(dá)功能準(zhǔn)則的指南。在沒有合適的通用、產(chǎn)品或產(chǎn)品類標(biāo)準(zhǔn)時(shí)，可作為制造商和購買方協(xié)商的性能規(guī)范的框架。
2）標(biāo)準(zhǔn)差異：進(jìn)行了語言的重新組織，GB/T17626.2-2006（idt IEC61000-4-2:2001）明確指出報(bào)告中應(yīng)包含的信息，具體要求如下：
IEC61000-4-2:2001
10 Test report
The test report shall contain all the information necessary to reproduce the test. In particular,
the following shall be recorded:
– the items specified in the test plan required by clause 8 of this standard;
– identification of the EUT and any associated equipment, for example, brand name, product
type, serial number;
– identification of the test equipment, for example, brand name, product type, serial number;
– any special environmental conditions in which the test was performed, for example,
shielded enclosure;
– any specific conditions necessary to enable the test to be performed;
– performance level defined by the manufacturer, requestor or purchaser;
– performance criterion specified in the generic, product or product-family standard;
– any effects on the EUT observed during or after the application of the test disturbance,
and the duration for which these effects persist;
– the rationale for the pass/fail decision （based on the performance criterion specified in the
generic, product or product-family standard, or agreed between the manufacturer and
the purchaser）;
– any specific conditions of use, for example cable length or type, shielding or grounding, or
EUT operating conditions, which are required to achieve compliance.
GB/T17626.2-2006
10.試驗(yàn)報(bào)告
試驗(yàn)報(bào)告應(yīng)包括能重現(xiàn)試驗(yàn)的全部信息。特別是下列內(nèi)容：
—— 本標(biāo)準(zhǔn)中第8章要求的在試驗(yàn)計(jì)劃中規(guī)定的項(xiàng)目內(nèi)容；
—— 受試設(shè)備和輔助設(shè)備的標(biāo)識(shí)，例如商標(biāo)、產(chǎn)品型號、序列號；
—— 試驗(yàn)設(shè)備的標(biāo)識(shí)，例如商標(biāo)，產(chǎn)品型號，序列號；
—— 任何進(jìn)行試驗(yàn)所需的專門環(huán)境條件，例如，屏蔽室；
—— 進(jìn)行試驗(yàn)所需的任何特定條件；
—— 制造商、委托方或購買方規(guī)定的性能水平；
—— 在通用、產(chǎn)品或產(chǎn)品類標(biāo)準(zhǔn)中規(guī)定的性能要求；
—— 試驗(yàn)時(shí)在騷擾施加期間及以后觀察到的對受試設(shè)備的任何影響，及其持續(xù)時(shí)間；
—— 試驗(yàn)通過/失敗的判斷原因（根據(jù)通用標(biāo)準(zhǔn)、產(chǎn)品標(biāo)準(zhǔn)或產(chǎn)品類標(biāo)準(zhǔn)規(guī)定的性能判據(jù)或制造商和購買方達(dá)成的協(xié)議）；
—— 采用的任何特殊條件，例如電纜長度或類型，屏蔽或接地，或受試設(shè)備運(yùn)行條件，均要符合規(guī)定。
5.修改了圖5，增加了圖8和圖9。
標(biāo)準(zhǔn)差異：修改了圖5對水平耦合板（HCP）間接放電的典型位置；圖8和圖9是對應(yīng)條款7.1.3不接地設(shè)備的試驗(yàn)方法增加的示意圖，增加了放電通路。
GB/T 17626.2-1998（idt IEC61000-4-2:1995）    GB/T17626.2-2006（idt IEC61000-4-2:2001）