詳細介紹 平行平晶是以光波干涉原理為基礎(chǔ),利用平晶的測量面與試件的被測量面之間所出現(xiàn)的干涉條紋來測量被測量面的誤差程度。平行平晶具有高精度的平面性和平行性。平行平晶用于檢定千分尺、杠桿千分尺、杠桿卡規(guī)和千分尺卡規(guī)等量具測量面的平面度和兩相對測量的平行度。平行平晶共分四個系列,每個系列各分六組,每組四塊。 功能:平行平晶用于干涉法測量千分尺、卡規(guī)和千分表等測量面平面度、平面平行度。產(chǎn)品規(guī)格:每組平行平晶共四塊,分四個尺寸系列組 測量面上平面度偏差: <0.1μm 平面度局部偏差: >0.03μm 測量面平行度誤差: 組Ⅰ系列允差值:0.06μm組Ⅱ、Ⅲ系列允差值:0.08μm組Ⅳ系列允差值:0.1μmPOP-1平行平晶0-25mm4塊/組POP-2平行平晶25-50mm4塊/組POP-3平行平晶50-75mm4塊/組POP-4平行平晶75-100mm4塊/組平行平晶尺寸系列表組號0-2525-5050-7575-100115.00,15.1215.25,15.3940.00,40.1240.25,40.3765.00,65.1265.25,65.3790.00,90.1290.25,90.37215.12,15.2515.37,15.5040.12,40.2540.37,40.5065.12,65.2565.37,65.5090.12,90.2590.37,90.50315.25,15.3715.50,15.6240.25,40.3740.50,40.6265.25,65.3765.50,65.6290.25,90.3790.50,90.62415.37,15.5015.62,15.7540.37,40.5040.62,40.7565.37,65.5065.62,65.7590.37,90.5090.62,90.75515.50,15.6215.75,15.8740.50,40.6240.75,40.8765.50,65.6265.75,65.8790.50,90.6290.75,90.87615.62,15.7515.87,16.0040.62,40.7540.87,41.0065.62,65.7565.87,66.0090.62,90.7590.87,91.00